Franz Josef Giessibl

Franz Josef Gießibl (* May 27, 1962 in Amerang) is a German physicist and university professor at the University of Regensburg.

Life

Giessibl studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Professor Gerhard Abstreiter and continued with a PhD in physics with Nobel Laureate Gerd Binnig at the IBM Physics Group Munich on atomic force microscopy. After submitting his PhD thesis in the end of 1991, he continued for 6 months as a Postdoctoral Fellow at the IBM Physics Group Munich and moved to Silicon Valley to join Park Scientific Instruments, Inc as a senior scientist and later director of vacuum products from mid 1992 until the end of 1994. He joined the Munich office of management consulting firm McKinsey & Company from 1995 to 1996 as a senior associate. During that time, he invented the qPlus sensor, a new probe for atomic force microscopy and continued experimental and theoretical work on the force microscope at the chair of Professor Jochen Mannhart at University of Augsburg where he received a habilitation in 2001.

In 2006, he joined the faculty at the Department of Physics at the University of Regensburg in Germany.[1] From about 2005, he collaborated with the scanning tunneling microscopy groups of IBM Almaden Research Center and IBM Zurich Research Laboratory and from about 2010 with National Institute of Standards and Technology to help to establish combined scanning tunneling microscopy and atomic force microscopy at ultralow temperatures. He was a visiting fellow at the center for nanoscience and technology (CNST) of the National Institute of Standards and Technology and a visiting professor at University of Maryland, College Park from fall 2015 to spring 2016.

Franz Giessibl is married and has two sons.

Trivia

Some of Giessibl's experimental images were the basis for the offset print editions Erster Blick (2000) and Graphit (2004) by visual artist Gerhard Richter.[2] Since 1990, Giessibl completed marathon races in Berlin,[3] Munich, Los Angeles, San Francisco, Honolulu and Florence with a personal best of about 3h 5min in 1992 in Munich. He enjoys reading a good book, running, biking, hiking, swimming, flying single engine planes and riding motorcycles.

Scientific contributions

Giessibl spent most of his professional career improving atomic force microscopy,[4][5][6][7][8] and published papers on ground breaking experiments,[9][10] instrumentation[11] and theoretical foundations[12][13] of atomic force microscopy. Giessibl is the inventor of the qPlus sensor,[14][15] a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever. His invention has enabled atomic force microscopy to obtain subatomic spatial resolution on individual atoms and submolecular resolution on organic molecules. Today, the qPlus sensor is used in many commercial and homebuilt atomic force microscopes.

Selected publications

Awards and Honors

Presentations (selection)

Interviews (selection)

References

  1. ↑ Website Franz Josef Gießibl (Uni Regensburg)
  2. ↑ Nielsen, K. H. (2008). "Nanotech, Blur and Tragedy in Recent Artworks by Gerhard Richter". Leonardo. 41 (5): 484. doi:10.1162/leon.2008.41.5.484.
  3. ↑ http://www.bmw-berlin-marathon.com/zahlen-und-fakten/ergebnisarchiv.html
  4. ↑ SPIEGEL ONLINE - Wissenschaft - 27. Juli 2000: Nanophysik: Atome unterm Mikroskop
  5. ↑ DIE WELT: 24. Januar 2003: Nanophysiker Franz Giessibl hantiert mit Apfelsinen
  6. ↑ The New York Times - 22. Februar 2008: Scientists Measure What It Takes to Push a Single Atom
  7. ↑ Physical Review Letters comments about 35 years of scanning tunneling microscopy and 30 years of atomic force microscopy
  8. ↑ Nature Nanotechnology's Anniversary issues of March and April 2016 mark the anniversary of a number of key discoveries in the history of nanotechnology.
  9. ↑ F. J. Giessibl: Atomic resolution of the Silicon (111)-(7x7) surface by atomic force microscopy. Science 267, Nr. 5194, 1995, p. 68–71.
  10. ↑ F. J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart: Subatomic features on the Silicon (111)-(7x7) surface observed by atomic force microscopy. In: Science. 289, Nr. 5478, 2000, p. 422-425.
  11. ↑ F. J. Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa: Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Phys. Rev. B 84, 2011, article number 125409, 15 pages.
  12. ↑ F. J. Giessibl: Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Phys. Rev. B 56, 1997, p. 16010–16015.
  13. ↑ F. J. Giessibl: Advances in atomic force microscopy. In: Reviews of Modern Physics. 75, Nr. 3, 2003, p. 949–983
  14. ↑ F. J. Giessibl: Device for noncontact intermittent contact scanning of a surface and a process therefore. US Patent 6240771
  15. ↑ F. J. Giessibl: Sensor for noncontact profiling of a surface. US Patent 8393009
  16. ↑ R&D 100 Award 1994 of R&D Magazine
  17. ↑ German Nanoscience Prize
  18. ↑ http://idw-online.de/pages/de/news42734
  19. ↑ Homepage Beckurts-Preis
  20. ↑ Colloquium Ehrenfestii
  21. ↑ Zernike Kolloquium
  22. ↑ Joseph F. Keithley Award for Advances in Measurement Science
  23. ↑ Vakuum in Forschung und Praxis Volume 27 Issue 5 (Oktober/November 2015)
  24. ↑ 2016 Foresight Institute Feynman Prize

External links

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